Leverage Functional Interfaces For High-Speed Test Access During All Phases Of The Silicon Lifecycle
Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were ...
If I’ve heard it once I’ve heard it a thousand times: Documentation is the least favorite part of engineering. But it also may be one of the most important and is growing to be more so. This was made ...
A new technical paper titled “FMEDA based Fault Injection to Validate Safety Architecture of SPI” was published by researchers at R.V. College of Engineering in India and Analog Devices. “The ...
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